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Seismic Processing

The industry’s leading seismic processing solution for generating high-definition images of the subsurface.

 

 

AspenTech Subsurface Seismic & Engineering (SSE) Epos™ software-based solutions offer a flexible, intuitive system for seismic processing, which scales from laptops and workstations to the largest HPC clusters. With a highly efficient parallel framework and comprehensive integration with enterprise IT infrastructure supporting high productivity, the software enables project geophysicists to concentrate on the on-time completion of high-definition geoscience workflows.

SEISMIC PROCESSING PRODUCTS

SCALABLE AND CONFIGURABLE, TO MEET ANY BUSINESS OBJECTIVE

Users look to AspenTech Subsurface SSE software when seeking a proven seismic processing system. The comprehensive Echos seismic processing tool offers an extensive library of seismic processing applications, with a complete suite of seismic data analysis applications.  This enables the adaptive construction of data-dependent processing workflows to solve today’s most challenging seismic processing problems.
 

ACCURATE EARTH MODEL = REDUCED DRILLING RISK

Geophysicists rely on GeoDepth™ for velocity determination and 3D/2D velocity model building, to create accurate seismic imaging in either time or depth.  This provides the geoscience workflow continuity needed to produce high-quality, interpretable images consistent with other available data and honoring geologic constraints.

Both Echos and GeoDepth are integrated with the open, innovative Epos infrastructure, which links all Epos-based applications in a true multi-user E&P environment, incorporating a shared data repository, common interfaces, and common visualization platforms for individuals or teams across disciplines.

HIGH-PRODUCTIVITY INTERACTIVE REFRACTION STATICS

For high productivity interactive Refraction Statics Analysis, AspenTech offers the XtremeGeo Flatirons™ solution for:

  • Geometry QC
  • First break picking
  • Multiple methods for analyzing and modeling refraction statics
  • Anisotropy refraction analysis
  • Eikonal tomography